针对核设施机电设备中控制系统存储单元耐辐射可靠性评价的需要, 以国产NOR型Flash存储器为研究对象, 对器件存储阵列浮栅单元的总剂量损伤阈值开展了实验研究。综合利用SMOTE算法和Bootstrap法建立了一种基于极小子样的器件耐辐照可靠性评价方法, 对被测样品校验失效剂量进行了统计分析。实验结果表明, 器件浮栅单元的主要失效模式为浮栅电荷损失造成的阈值电压降低, 平均校验错误剂量为(631.89±103.64)Gy(Si)。统计分析表明, 器件总剂量损伤阈值服从对数正态分布。基于SMOTE-Bootstrap的可靠性评价方法避免了传统Bootstrap再生样本过于集中的问题, 可应用于极小子样的可靠性评价。

频率干扰修复是维护通信链路正常功能的有效手段。频率干扰修复系统作战效能的发挥主要依赖于支撑网系和相关**装备的间接作用，影响因素包含的信息量少且不确定性大。因此，针对频率干扰修复系统作战效能评估问题，提出将灰色层次法运用到作战效能的评估过程中。分析并构建了频率干扰修复系统作战效能评估指标体系，在此基础上建立了灰色层次评估模型。最后，通过对算例进行计算分析，验证了方法的有效性和模型的合理性。

Optical security devices play an essential role in the fight against counterfeiting. In this paper, we study and design a pair of metal-dielectric optical filters based on metameric effect, which offer a hidden image effect by the color shift at a specific angle of observation. Compared with all-dielectric multilayer system, the metal-dielectric multilayer structure has larger color shift with varying incident angle, higher color saturation and fewer layers. Finally, the stacks with 5 layers and 7 layers are achieved, and the color difference index is only 0.71, which shows good metameric matching effect. Simultaneously, the sensitivity of filters to deposition errors is analyzed when the thickness deviation is ±2%, and the results show that the two filters have good manufacturability.

In order to increase the anti-counterfeiting performance of optically variable devices, the innovative interference security image structures based on metamerism have been developed. In this letter, we show a pair of all-dielectric metameric filters offering a hidden image effect with the color shift at a specific angle of observation. These filters are designed by two materials TiO2/SiO2 based on the different angle color target optimization. The 6-layer- and 9-layer stacks are achieved and the performance of prototype filters prepared by remote plasma sputtering is shown. The color difference index of the experiment is up to 1.19, which shows good metameric matching effect.